Conference Contributions
Corinna Kofler, Claudia Anna Dohr, Judith Dohr, Anja Zernig
Data-centric model development to improve the CNN classification of defect density SEM images
48th Annual Conference of the Industrial Electronics Society IECON 2022 Conference
October 17 - 20, 2022, Brussels, Belgium
Mustafa Onur Izmitlioglu, Mujdat Soyturk
24th International Microwave and Radar Conference (MIKON 2022)
12-14 September 2022, Warsaw, Poland
Miroslav Hagara, Peter Kubinec, Alexander Šatka, Radovan Stojanović
FPGA implementation of histogram-based thresholding.
11th Mediterranean Conference on Embedded Computing (MECO)
June 7-10, 2022, Budva, Montenegro,
L.Du, X.Zhao, P.Watte, R.Poelma, W.v.Driel, G.Zhang
Investigation of Potting Compounds on Thermal-Fatigue properties of Solder Interconnects
48th Annual Conference of the Industrial Electronics Society IECON 2022 Conference
October 17 - 20, 2022, Brussels, Belgium
Kutalmış Coşkun, Zeynep Kumralbaş, Hazel Çavuş, Borahan Tümer
The German Conference on Pattern Recognition (GCPR)
Tue 27. – Fri 30. September, Konstanz, Germany
Jose Luis de la Vara; Thomas Bauer; Bernhard Fischer; Mustafa Karaca; Henrique Madeira; Martin Matschnig; Silvia Mazzini; Giann Spilere Nandi; Fabio Patrone; David Pereira; José Proença; Rupert Schlick; Stefano Tonetta; Ugur Yayan; Behrooz Sangchoolie
Quality of Information and Communications Technology (QUATIC 2021) & Communications in Computer and Information Science
September 8-10, 2021 (online)
Rok Hribar, Gašper Petelin, Margarita Antoniou, Anton Biasizzo, Stanko Ciglarič, Gregor Papa
On Suitability of the Customized Measuring Device for Electric Motor
48th Annual Conference of the Industrial Electronics Society IECON 2022 Conference
October 17 - 20, 2022, Brussels, Belgium
Kutalmıs Coskun, Onur Izmitlioglu, Mujdat Soyturk, Borahan Tumer, Deniz Gunes¸ Sinan Saracoglu, Baris Bulut, Burak Ketmen, Ismethan Hanedar, Tasdemir Asan, Eray Aydın, Ahmet Hamdi Levent
An AI-based architecture framework for improving end of line reliability tests of electric motors
48th Annual Conference of the Industrial Electronics Society IECON 2022 Conference
October 17 - 20, 2022, Brussels, Belgium
Francisco L´opez de la Rosa , Jos´e L. G´omez-Sirvent , Corinna Kofler , Rafael Morales, Antonio Fernandez-Caballero
9th International Work-Conference on the Interplay between Natural and Artificial Computation (IWINAC 2022) & Lecture Notes in Computer Science
Jun 03, 2022 - Jun 03, 2022 Tenerife , Spain
A. Bettini , T. Cosnier, A. Magnani, O. Syshchyk, M. Borga, S. Decoutere, A. Neviani
Analysis and Design of a Fully-Integrated Pulsed LiDAR Driver in 100V-GaN IC Technology
17th International Conference on PhD Research in Microelectronics and Electronics (PRIME 2022)
12-16 June 2022, Tanka Village, Villasimius (Ca) Italy
F. Chiocchetta, C. De Santi, F. Rampazzo, K. Mukherjee, Jan Grünenpütt, Daniel Sommer, Hervé Blanck, Benoit Lambert, A. Gerosa, G. Meneghesso, E. Zanoni , M. Meneghini
33rd European Symposium on Reliability of Electron Devices Failure Physics and Analysis (ESREF2022)
September 26-29, 2022 Berlin, Germany
C. Lai, P. Baraldi, I. Ahmed, E. Zio, A. Del Cueto, Javier Gil, Sergio Llorente
32nd European Safety and Reliability Conference (ESREL2022)
28th August – 1st September 2022 Dublin, Ireland
F. Hosseinpour, I. Ahmed, P. Baraldi, M. Behzad, E. Zio, H. Lewitschnig
32nd European Safety and Reliability Conference (ESREL2022)
28th August – 1st September 2022 Dublin, Ireland
Modolo, Nicola; Fregolent, Manuel; Masin, Fabrizio; Benato, Andrea; Bettini, Andrea; Buffolo, Matteo; De Santi, Carlo; Borga, Matteo; Posthuma, Niels; Bakeroot, Benoit; Decoutere, Stefaan; Vogrig, Daniele; Neviani, Andrea; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo
Capture and emission time map to investigate the positive VTH shift in p-GaN power HEMTs
33rd European Symposium on Reliability of Electron Devices Failure Physics and Analysis
September 26-29, 2022 Berlin, Germany
P. Baraldi, S. Medici, I. Ahmed, E. Zio, H. Lewitschnig
A Method Based on Gaussian Process Regression for Modelling Burn-in of Semiconductor Devices
31st European Safety and Reliability Conference
19-23.09.2021, Angers, France (hybrid event)
J. Marek, J. Kozárik, A. Chvála, M. Minárik and M. Donoval
Degradation Of Power Sic Mosfet Under Repetitive Uis And Short Circuit Stress
The 15th International Seminar on Power Semiconductors (ISPS 2021)
25 August - 27 August 2021, Prague, Czech Republic
P. Watté, G. van Hees, R. Engelen, W.D van Driel
Reliability of Electronic Drivers: An Industrial Approach
ASME 2021 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems
October 25 – 27, 2022 Hyatt Regency Orange County, Garden Grove, CA
P. Sanaa, A. Graffa, S. Hübnera, M. Simone-Najaseka, V. Zhan Gaob, F. Rampazzob, B. Lambertc, G. Meneghessob, E. Zanonib, M. Meneghinib and F. Altmanna
Microstructural Degradation Investigations of OFF-State Stressed 0.15 µm RF AlGaN/GaN HEMTs: Failure Mode related Breakdown
WiPDA, the IEEE Wide Bandgap Power Devices and Applications workshop
November 7-9, 2021, Redondo Beach, California
K. Pressel, J. Moser, S. Rzepka, K. Brinkfeldt, S. Zhao, W. van Driel, P. Giammatteo, B. Bulut, Soyturk, L. Pomante
The H2020-ECSEL Project” iRel40” (Intelligent Reliability 4.0)
DSD 2021
September 1-3, 2021, Palermo, Italy
L. Hahne, F.A. Velarde G., A. Lange, Chr. Sohrmann, D. Wetzel, S. Crocoll
ReliaVision: In-circuit transistor reliability investigation using XML-based technology reliability information in PDKs
IEEE International Integrated Reliability Workshop (IIRW)
October 2021, (online)
W.D. Van Driel, B.J.C. Jacobs, P. Watte, X. Zhao,
Reliability of LED-based Systems
International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)
6-27.07.2020 (online event)
P. Watté, G. van Hees, R. Engelen, W.D van Driel
Reliability of electronic drivers: An industrial approach
ASME 2021 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems,
InterPACK2021
October 26-28, 2021, (online)
M. Hashemi, M. A. Golkani, D. Watzenig
A Robust Approach for Inter-Turn Fault Detection of PMSM Used for Autonomous Vehicles
International Conference on Connected Vehicles and Expo
February 21-23, 2022, Florida, USA
J. Marek, J. Kozárik, A. Chvála, M. Minárik, M.Donoval
Power SIC MOSFET Under Repetitive UIS and Short Circuit Stress
Advances in Electronic and Photonic Technologies (ADEPT 2021)
20-23.09.2021, Podbanské, Slovakia
S. Grubmueller, P. Innerwinkler
A Framework for the Determination of realistic Usage Profiles for Automated Shuttle Pods
IEEE International Conference on Connected Vehicles and Expo 2022
March 7-9, 2022, Florida, USA
J. Zündel, M. Sagerer, M. Frewein, T. Krivec
Characterization of prepreg shrinkage and investigation of its influence on warpage simulation
EuroSimE Conference 2021
July 6 - 8, 2021, (online)
M. Frewein, S. Stojanovic, Q. Tao, T. Krivec, J. Zuendel, M. Goessler, P. F. Fuchs, M. Gschwandl
An advanced, systematic simulation approach for studying warpage drivers of an assembled printed circuit board in early development stage
EuroSimE Conference 2022
April 24 - 27, 2022, Malta
F. Chiocchetta, C. De Santi, F. Rampazzo, K. Mukherjee, Jan Grünenpütt, Daniel Sommer, Hervé Blanck, Benoit Lambert, G. Meneghesso, E. Zanoni, and M. Meneghini
GaN RF HEMT Reliability: Impact of Device Processing on I-V Curve Stability and Current Collapse
International Reliability Physics Symposium 2022
March 27-31, 2022, Dallas, Texas
M. Millesimo, B. Bakeroot, M. Borga, N. Posthuma, S. Decoutere, E. Sangiorgi, C. Fiegna, and A. N. Tallarico
Gate Reliability of p-GaN Power HEMTs Under Pulsed Stress Condition
2022 IEEE International Reliability Physics Symposium (IRPS)
March 27-31, 2022, Dallas, TX, USA
T. Krivec
Virtual Assessement of Power Packages
8th European Expert Workshop on Reliability of Electronics and Smart Systems
October 22, 2020, (online)
D. Kostynski, S. Sack, M. Sievers
Active Thermal Cycling of Discrete Power Semiconductors for Applications with strong ∆T-Profiles
12th International Conference on Integrated Power Electronics Systems
March 18-20, 2022, Berlin, Germany
B.S.Çağlar, H.B.Ketmen, B. Bulut
Anomaly Detection using Audio Signals
International Aegean Scientific Research Symposium 2021
December 25-26, 2021, (online)
T.Happonen, A.Korhonen, P.Järvinen, M.Turunen, T. Liimatta, M. Paakkolanvaara, and T.Alajoki
Roll-to-roll manufacturing and reliability assessment of stretchable temperature sensors
LOPEC 2022
March 23–24, 2022, München, Germany
R. Dudek, R. Döring, A. Mathew, A. Otto, S. Rzepka
Modelling Thermal Fatigue in Power Electronics
EuroSimE 2022
April 25 – 27, 2022, Malta
T. Krivec
Virtual warpage analysis as major tool for “Design for Reliability” for PCBs and IC-substrates
Integrated Computational Materials, Process and Product Engineering - IC-MPPE 2022
May 6, 2022, Leoben, Austria