Journal Articles & Books
Anselmo Martínez; Lidia M. Belmonte; Arturo S. García; Antonio Fernández-Caballero; Rafael Morales
Facial Emotion Recognition from an Unmanned Flying Social Robot for Home Care of Dependent People
Electronics (2021): 10(7), 868
Belmonte, L.M.; Segura, E.; Fernández-Caballero, A.; Somolinos, J.A.; Morales, R.
Mathematics (2021): 9(12), 1424
F. Emadi; V. Vuorinen; G. Ross; M. Paulasto-Kröckelk
Co, In, and Co–In alloyed Cu6Sn5 interconnects: Microstructural and mechanical characteristics
Materials Science and Engineering: A (2023): 881, 145398
Jakob Willner, Lukas Brunnbauer, C. Derrick Quarles, Jr., Michael Nelhiebel, Silvia Larisegger, Andreas Limbeck
Development of a simultaneous LA-ICP-MS & LIBS method for the investigation of polymer degradation
The Royal Society of Chemistry (2023): 38, 2028-2037
M. Millesimo, M. Borga, L. Valentini, B. Bakeroot, N. Posthuma, A. Vohra, S. Decoutere, C. Fiegna, A. N. Tallarico
Role of the GaN-on-Si Epi-Stack on ∆RON Caused by Back-Gating Stress
IEEE Transactions on Electron Devices (2023): 5203 - 5209
SUMIRAN MEHRA, GOPAL RAUT, RIBHU DAS, SANTOSH KUMAR VISHVAKARMA, ANTON BIASIZZO
An Empirical Evaluation of Enhanced Performance Softmax Function in Deep Learning
IEEE Access (2023): 34912 - 34924
Jiarui Mo, Jinglin Li, Yaqian Zhang, Alexander May, Tobias Erlbacher, Guoqi Zhang, Sten Vollebregt
A Highly Linear Temperature Sensor Operating up to 600◦C in a 4H-SiC CMOS Technology
IEEE Electron Device Letters (2023): 995 - 998
Lukas Brunnbauer, Veronika Zeller, Zuzana Gajarska, Silvia Larisegger, Stefan Schwab, Hans Lohningner, Andreas Limbekck
Spectrochimica Acta Part B (2023): 207, 106739
Jakob Willner, Lukas Brunnbauer, Silvia Larisegger, Michael Nelhiebel, Martina Marchetti-Deschmann, Andreas Limbeck
Talanta (2023): 256, 124305
Francisco López de la Rosa, José L. Gómez-Sirvent, Rafael Morales,Roberto Sánchez-Reolid, Antonio Fernández-Caballero
Computers and Industrial Engineering (2023): 109549
By Yun Chen, Luis Carlos Castro Heredia, Johan J. Smit, Mohamad Ghaffarian Niasar, Robert Ross
Giant magneto-resistive (GMR) sensors for non-contacting partial discharge detection
IEEE Transactions on Instrumentation and Measurement (2023): 6004411
Martin Kemeny, Peter Ondrejka, Miroslav Mikolasek
Batteries (2023): 9(1), 33
M. Millesimo, M. Borga, B. Bakeroot, N. Posthuma, S. Decoutere, E. Sangiorgi, Life Fellow, IEEE, C. Fiegna, A. N. Tallarico
The Role of Frequency and Duty Cycle on the Gate Reliability of p-GaN HEMTs
IEEE Journal of Electron Device Letters (2022): 1846 - 1849
F. Bonet, O. Aviñó-Salvad ó, M. Vellvhi, X. Jorda, P. Godignon, X. Perpiñà.
Carrier Concentration Profile in 1.2 kV SiC Schottky diodes under Current Crowding
IEEE Journal of Electron Device Letters (2022): 938 - 941
Joshua Lommesa, Gesa Patzelta, Volkmar Stenzel
Microelectronic Engineering (2023): 277, 112014
O. Aviñó-Salvadó, C. Buttay, F. Bonet, C. Raynaud, P. Bevilacqua, J. Rebollo, H. Morel, X. Perpiñà
IEEE Transactions on Industrial Electronics (2023): 1-10
de la Rosa, Francisco López, José L. Gómez-Sirvent, Roberto Sánchez-Reolid, Rafael Morales, and Antonio Fernández-Caballero.
Expert Systems with Applications (2022): 117731.
Hagara, Miroslav, Radovan Stojanović, Alexander Šatka, Peter Kubinec, and Oldřich Ondráček.
Modified algorithm of unimodal thresholding for FPGA implementation
Microprocessors and Microsystems 94 (2022): 104669.
López de la Rosa, Francisco, Roberto Sánchez-Reolid, José L. Gómez-Sirvent, Rafael Morales, and Antonio Fernández-Caballero.
Applied Sciences 11, no. 20 (2021): 9508.
Modolo, N., C. De Santi, G. Baratella, A. Bettini, M. Borga, N. Posthuma, B. Bakeroot et al.
Compact Modeling of Nonideal Trapping/Detrapping Processes in GaN Power Devices
IEEE Transactions on Electron Devices 69, no. 8 (2022): 4432-4437.
de la Rosa, Francisco López, José L. Gómez-Sirvent, Rafael Morales, Roberto Sánchez-Reolid, and Antonio Fernández-Caballero.
Applied Soft Computing (2022): 109743.
Millesimo, M., C. Fiegna, N. Posthuma, M. Borga, B. Bakeroot, S. Decoutere, and A. N. Tallarico
High-Temperature Time-Dependent Gate Breakdown of p-GaN HEMTs
IEEE Transactions on Electron Devices 68, no. 11 (2021): 5701-5706
Olschewski, Thomas.
Fast Accurate Defect Detection in Wafer Fabrication
arXiv preprint arXiv:2108.11757 (2021)
Olschewski, Thomas
Defect Detection on Semiconductor Wafers by Distribution Analysis
arXiv preprint arXiv:2111.03727 (2021)
Safari, Leila, Gianluca Barile, Vincenzo Stornelli, Shahram Minaei, and Giuseppe Ferri
Towards Realization of a Low-Voltage Class-AB VCII with High Current Drive Capability
Electronics 10, no. 18 (2021): 2303
Van Driel, Willem D., B. Jacobs, P. Watte, and X. Zhao
Reliability of LED-based systems
Microelectronics Reliability 129 (2022): 114477
Tallarico, A. N., M. Millesimo, B. Bakeroot, M. Borga, N. Posthuma, S. Decoutere, E. Sangiorgi, and C. Fiegna
IEEE Transactions on Electron Devices 69, no. 2 (2021): 507-513
Meneghini, Matteo, Carlo De Santi, Idriss Abid, Matteo Buffolo, Marcello Cioni, Riyaz Abdul Khadar, Luca Nela et al
GaN-based power devices: Physics, reliability, and perspectives
Journal of Applied Physics 130, no. 18 (2021): 181101
Bonet, F., O. Aviñó-Salvadó, M. Vellvehi, X. Jordà, P. Godignon, and X. Perpiñà
Carrier Concentration Analysis in 1.2 kV SiC Schottky Diodes under Current Crowding
IEEE Electron Device Letters (2022) (Early Access)
Book chapter:
van Driel, W. D., B. J. C. Jacobs, G. Onushkin, P. Watte, X. Zhao, and J. Lynn Davis
Reliability and Failures in Solid State Lighting Systems
In Reliability of Organic Compounds in Microelectronics and Optoelectronics, pp. 211-240. Springer, 2022.
Book chapter:
van Driel, W. D., M. Yazdan Mehr, X. J. Fan, and G. Q. Zhang
Outlook: From Physics of Failure to Physics of Degradation
In Reliability of Organic Compounds in Microelectronics and Optoelectronics, pp. 535-538. Springer, 2022.
Book chapter:
Ross, R., and Koopmans, G.
Reliability and Degradation of Power Electronic Materials
In Reliability of Organic Compounds in Microelectronics and Optoelectronics, pp. 449-478. Springer, 2022.